info@buecher-doppler.ch
056 222 53 47
Warenkorb
Ihr Warenkorb ist leer.
Gesamt
0,00 CHF
Zum Warenkorb
Zur Kasse

Kategorien

Art

Preisspanne

Zurücksetzen

67 Ergebnisse - Zeige 1 von 20.

Advances in Electronic Testing

Advances in Electronic Testing

Folgt in ca. 15 Arbeitstagen
188,00 CHF
Timing Performance of Nanometer Digital Circuits Under Process Variations

Timing Performance of Nanometer ...

Folgt in ca. 5 Arbeitstagen
157,00 CHF
Power-Constrained Testing of VLSI Circuits

Power-Constrained Testing of VLSI ...

Folgt in ca. 15 Arbeitstagen
134,00 CHF
Soc (System-On-A-Chip) Testing for Plug and Play Test Automation

Soc (System-On-A-Chip) Testing for ...

Folgt in ca. 15 Arbeitstagen
134,00 CHF
Introduction to IDDQ Testing

Introduction to IDDQ Testing

Folgt in ca. 15 Arbeitstagen
134,00 CHF
Data Mining and Diagnosing IC Fails

Data Mining and Diagnosing ...

Folgt in ca. 15 Arbeitstagen
134,00 CHF
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

Essentials of Electronic Testing ...

Folgt in ca. 15 Arbeitstagen
157,00 CHF
Oscillation-Based Test in Mixed-Signal Circuits

Oscillation-Based Test in Mixed-Signal ...

Folgt in ca. 15 Arbeitstagen
188,00 CHF
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Defect-Oriented Testing for Nano-Metric ...

Folgt in ca. 15 Arbeitstagen
236,00 CHF
Timing Performance of Nanometer Digital Circuits Under Process Variations

Timing Performance of Nanometer ...

Folgt in ca. 10 Arbeitstagen
157,00 CHF
Boundary-Scan Interconnect Diagnosis

Boundary-Scan Interconnect Diagnosis

Folgt in ca. 15 Arbeitstagen
188,00 CHF
Efficient Branch and Bound Search with Application to Computer-Aided Design

Efficient Branch and Bound ...

Folgt in ca. 15 Arbeitstagen
134,00 CHF
Emerging Nanotechnologies

Emerging Nanotechnologies

Lieferbar in ca. 20-45 Arbeitstagen
237,00 CHF
Research Perspectives and Case Studies in System Test and Diagnosis

Research Perspectives and Case ...

Folgt in ca. 15 Arbeitstagen
188,00 CHF
On-Line Testing for VLSI

On-Line Testing for VLSI

Folgt in ca. 15 Arbeitstagen
134,00 CHF
Testability Concepts for Digital ICs

Testability Concepts for Digital ...

Folgt in ca. 15 Arbeitstagen
188,00 CHF
Delay Fault Testing for VLSI Circuits

Delay Fault Testing for ...

Folgt in ca. 15 Arbeitstagen
188,00 CHF
Multi-Chip Module Test Strategies

Multi-Chip Module Test Strategies

Folgt in ca. 15 Arbeitstagen
134,00 CHF
From Contamination to Defects, Faults and Yield Loss

From Contamination to Defects, ...

Folgt in ca. 15 Arbeitstagen
134,00 CHF
Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation

Fault Injection Techniques and ...

Folgt in ca. 15 Arbeitstagen
188,00 CHF